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Abstract: Gamma-ray irradiation and post-irradiation responses have been studied for the two types of radiation sensitive p-channel MOSFETs (RADFETs) from different manufacturers. In addition to, in dosimetric applications standard, threshold voltage measurements at a single specified current, transistor – and charge-pumping characteristics have been monitored. This has been shown to…

Abstract: The density of fixed traps (FTs), Nft (cm−2), during isothermal annealing of irradiated radiation-sensitive field-effect transistors (RADFETs) from room temperature to 200 ◦C has been modelled. The modelling has shown that a simple, two-defect model (2DM), containing two defect types: one defect type for positively charged FTs (PCFTs), and…

Abstract: Pre-irradiation device characteristics, gamma radiation response, and possible use in radiation dosimetry have been investigated for MOSFETs with a 100 nm thick Er2O3 gate dielectric. The performance of these novel devices has been compared with that of commercial pMOS dosimeters (RadFETs) with a standard SiO2 gate oxide of the…